智能芯片采样率数据集

芯片采样率数据集主要面向宽频高效自供电/无线供电原理与异质异构微系统集成需求，进行低功耗边缘决策智能芯片设计技术研究，数据主要基于中国赛宝实验室工业和信息化部电子第五研究所GJX-5i标准振动激励台产生，主要记录了检验环境在15~35℃，相对湿度45~75%RH，气压86~106kPa下，5只SM-ZN1A型智能芯片的采样频率的观测值。The Chip Sampling Rate Dataset is developed to address the demands of wide-bandwidth high-efficiency self-powered/wireless-powered technologies and heterogeneous microsystem integration, focusing on research into low-power edge decision-making intelligent chip design. The dataset was primarily generated using the GJX-5i standard vibration excitation table from China CePREI, the 5th Electronics Research Institute under the Ministry of Industry and Information Technology of the People's Republic of China. It mainly documents the observed sampling frequency values of 5 SM-ZN1A-type intelligent chips under the test environment with a temperature range of 15–35℃, relative humidity of 45–75% RH, and atmospheric pressure of 86–106 kPa.

搜集汇总

背景与挑战

背景概述

该数据集面向宽频高效自供电/无线供电原理与异质异构微系统集成需求，用于低功耗边缘决策智能芯片设计技术研究。数据基于标准振动激励台产生，记录了特定环境条件下5只SM-ZN1A型智能芯片的采样频率观测值。