稳定工作的二维纳机电谐振传感器测试数据集

本数据集/数据库主要是基于不同二维材料制备的二维纳机电谐振器器件性能的测试数据，测试的主要指标是频率稳定度。测试的主要手段是基于锁相环搭建的闭环测试环路，测量的数据也即是：在不同测试温度下，一定积分时间1秒内，器件的谐振频率变化情况。本数据集/数据库主要数据项包含了在不同测试温度下，二维纳机电谐振传感器谐振频率随时间变化的扰动情况。This dataset/database primarily contains test data characterizing the performance of two-dimensional nano-electromechanical resonator devices fabricated from diverse two-dimensional materials. The primary test metric is frequency stability. The core test methodology adopts a closed-loop test setup built with a phase-locked loop (PLL), and the collected measured data refers to the resonant frequency variations of the devices within a fixed 1-second integration time under different test temperatures. The main data items of this dataset/database cover the time-dependent perturbation of the resonant frequency of two-dimensional nano-electromechanical resonant sensors under varying test temperatures.

搜集汇总

背景与挑战

背景概述

该数据集提供了基于不同二维材料制备的二维纳机电谐振器性能测试数据，核心关注频率稳定度指标。通过锁相环闭环测试环路，测量了在不同温度下，器件的谐振频率在1秒积分时间内的扰动变化情况。