REX — a least-squares fitting program for the simulation and analysis of X-ray reflectivity data

Abstract A FORTRAN program REX, which has been developed to facilitate the interpretation of X-ray reflectivity data, is described. The program allows the simulation of reflectivity profiles as a function of either incident angle or of energy. Factors such as anomalous dispersion, and surface and interface roughness are taken into account in the model. In addition, experimental data of reflectivity as a function of incident angle can be matched to user-supplied theoretical parameters by a least-square... Title of program: REX Catalogue Id: ACPI_v1_0 Nature of problem Interpretation of X-ray reflectivity spectra from thin films or multilayers. Versions of this program held in the CPC repository in Mendeley Data ACPI_v1_0; REX; 10.1016/0010-4655(93)90188-I This program has been imported from the CPC Program Library held at Queen's University Belfast (1969-2019)摘要：本文介绍了一款为辅助X射线反射率（X-ray reflectivity）数据解析而开发的FORTRAN程序REX。该程序可模拟随入射角或能量变化的反射率曲线，模型中纳入了反常色散（anomalous dispersion）、表面与界面粗糙度等因素。此外，可通过最小二乘方法将随入射角变化的反射率实验数据与用户提供的理论参数进行匹配。 程序名称：REX 目录编号：ACPI_v1_0 问题类型 用于解析薄膜或多层膜的X射线反射率谱。 该程序在Mendeley数据的CPC库中的版本：ACPI_v1_0; REX; 10.1016/0010-4655(93)90188-I 本程序源自贝尔法斯特女王大学馆藏的CPC程序库（1969-2019）