Abstract Title of program: FIREFLY II Catalogue number: AAQB Program obtainable from: CPC Program Library, Queen's University of Belfast, N. Ireland (see application form in this issue) Computer: ICL
The purpose of this experiment is to benchmark the new high-throughput XRR setup on the GMT instrument with a series of measurements of buried interfaces in direct bonded Si wafers
The purpose of the experiment is to perform a practical with M2 students of the UGA. The topic of the practical will be the investigation of bonding interfaces in Si wafer using X-ray reflectivity.
