Surface Topography Challenge - Sample A57

The devices used for the challenge were the Whitelight Interferometer and the Keyence VR Microscope.

The Keyence VR Microscope used λs at 800μm and λc at 0.8mm as the cutoff parameters. The measurements data used values up to three decimal places. This measurement device performs well with most surfaces but can have issues with measuring surfaces that are reflective. The results showed that the Ra was 0.060μm in the measured area for line roughness.

The Whitelight Interferometer used a 2mm x 2mm area in order to obtain the surface roughness. This area is used for all specimens to ensure repeatability and consistency within the analysis. The data provided for the Whitelight Interferometer will be in an .OPDx file. The results displayed 10.935nm for the Ra.

本次挑战赛所使用的测量设备为白光干涉仪（Whitelight Interferometer）与基恩士VR显微镜（Keyence VR Microscope）。

基恩士VR显微镜以800μm的λs与0.8mm的λc作为截止参数。测量数据保留至小数点后三位。该测量设备对绝大多数表面均可实现优异的测量效果，但在测量高反射表面时可能出现测量误差。测量区域内的线粗糙度Ra值为0.060μm。

白光干涉仪采用2mm×2mm的扫描区域以采集表面粗糙度数据。所有试样均采用该区域进行测量，以确保分析过程的可重复性与一致性。白光干涉仪的测量数据将存储于.OPDx格式文件中，其测得的线粗糙度Ra值为10.935nm。

搜集汇总

背景与挑战

背景概述

该数据集是表面形貌挑战的样本A57，包含来自Keyence VR显微镜和白光干涉仪的两种测量数据，分别提供线粗糙度Ra=0.060μm和表面粗糙度Ra=10.935nm的结果。数据集为实验数据，具有详细的仪器参数和测量条件，适用于表面粗糙度分析和比较研究。