CeBi的ARPES数据集

在低载流子体系CeBi中直接观测证明了近藤杂化引起的微弱电荷涨落效应。该项工作发表在Phys. Rev. B。研究利用ARPES实验手段，通过变温与共振条件直接证明在低温下CeBi电子口袋变大是由于近藤效应引起的微弱电荷涨落引起，该项实验直接利用光电子能谱手段证明了理论设想的真实性。数据量1.1GB。We directly observed and verified the weak charge fluctuation effect induced by Kondo hybridization in the low-carrier compound CeBi. This work was published in Physical Review B (Phys. Rev. B). Using angle-resolved photoemission spectroscopy (ARPES) with temperature-dependent and resonant photoexcitation conditions, the study directly demonstrated that the enlargement of the electron pocket of CeBi at low temperatures arises from the weak charge fluctuation induced by the Kondo effect. This experiment directly confirmed the validity of the previously proposed theoretical hypothesis via photoemission spectroscopy. The dataset has a size of 1.1 GB.

搜集汇总

背景与挑战

背景概述

该数据集聚焦于CeBi材料的温度依赖电子结构研究，通过ARPES实验直接观测并证明了近藤效应引起的微弱电荷涨落，验证了理论设想。数据来自国家重点研发计划项目，包含1.15GB的原始实验文件，适用于凝聚态物理学领域的强关联体系分析。