2X-thru

s11 and s21:hows the ADS simulation of 2X-thru, where the S2P files of fixtures A and B are introduced to observe whether fixtures A and B are symmetric. It can be seen from the insertion loss S21 and return loss S11 of the 2X-thru simulation in Fig. 5(c) that the insertion losses of fixtures A and B almost coincide, but the return loss is not completely coincident because of the discontinuous impedance of the transmission line of fixtures A and B at the connection between the coaxial connector and the PCB. In Fig. 5(c), T11, the impedances of fixtures A and B at the interface of the SMA to the microstrip line are 55.15 and 52.24 Ω, respectively, with a difference of 2.91 Ω. Owing to process instability and errors in circuit fabrication, there are large differences in the S parameters of fixtures A and B, which may lead to inaccurate and unsatisfactory test results. In the actual production process, completely symmetric fixtures A and B could not be fabricated; therefore, errors between them were inevitable. In addition to the unavoidable factors, the 2X-thru structure designed in this study is symmetrical and can provide significant reference data for testing.s11与s21：对应2X直通结构的先进设计系统（Advanced Design System，ADS）仿真结果，其中引入夹具A与夹具B的S2P文件，以验证两夹具是否对称。由图5(c)中2X直通仿真的插入损耗S21与回波损耗S11可知，夹具A与夹具B的插入损耗基本重合，但回波损耗并未完全一致——这是由于两夹具的传输线在同轴连接器与印制电路板（Printed Circuit Board，PCB）连接处存在阻抗不连续现象。在图5(c)中，T11对应的SMA接头（SubMiniature version A）至微带线接口处，夹具A与夹具B的阻抗分别为55.15Ω与52.24Ω，二者差值为2.91Ω。受电路制作过程中的工艺不稳定性与误差影响，夹具A与夹具B的散射参数（S-parameter）存在较大差异，这可能导致测试结果不准确且效果欠佳。在实际生产流程中，无法制备完全对称的夹具A与夹具B，因此二者之间的误差不可避免。除上述不可控因素外，本研究所设计的2X直通结构具备对称性，可为测试工作提供极具参考价值的数据。

搜集汇总

背景与挑战

背景概述

该数据集名为'2X-thru'，是一个信号处理相关的数据集，包含.s2p格式的文件，用于分析ADS模拟中fixtures A和B的S参数（如插入损失和返回损失），以评估它们的对称性。数据集强调了由于制造工艺不稳定导致的阻抗差异和不可避免的误差，为测试提供了参考数据。