逆向设计片上系统数据

逆向设计片上系统主要面向片上逆向设计器件研究，片上小尺寸，高性能器件需求建设，基于华中科技大学武汉光电国家研究中心实验室条件进行测试。主要记录了片上小尺寸逆向设计器件的算法，单元器件的性能，通光谱等数据。以及基于单元器件组成的片上多模复用，解复用，多模交叉波导，光学混频操作等功能的测试数据。Reverse-designed on-chip systems are primarily developed for research on on-chip reverse-designed devices and the demand for small-sized, high-performance on-chip components. This dataset was tested under the laboratory conditions of the Wuhan National Laboratory for Optoelectronics at Huazhong University of Science and Technology. It mainly records data including algorithms of small-sized on-chip reverse-designed devices, performance parameters of unit devices, transmission spectra, etc. Additionally, it includes test data for on-chip functions implemented with these unit devices, such as multimode multiplexing, demultiplexing, multimode crossing waveguides, optical mixing operations and other related functional test data.

搜集汇总

背景与挑战

背景概述

该数据集聚焦于片上逆向设计器件研究，旨在满足小尺寸、高性能器件的需求。它记录了逆向设计器件的算法、单元器件性能、通光谱等数据，并包含了片上多模复用、解复用、交叉波导和光学混频操作等功能的测试数据。数据基于华中科技大学武汉光电国家研究中心的实验室条件进行测试。