Characterization of epsilon-Fe2O3 and AlFeO3 films
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Initial characterization of e-Fe2O3 and AlFeO3 films. XAS/XMCD and RIXS/RIXS-MCD of films at 300K in field with orientation dependence.
创建时间:
2025-04-22

Initial characterization of e-Fe2O3 and AlFeO3 films. XAS/XMCD and RIXS/RIXS-MCD of films at 300K in field with orientation dependence.