EPID: The Enfield PCB Inspection Dataset for Visual Defect Detection

This dataset contains high-resolution images of printed circuit boards (PCBs) captured under controlled laboratory conditions for research on defect detection. It includes both undamaged boards and boards with artificially introduced defects (burned integrated circuits (ICs), melted IC pins, popped capacitors), documented step-by-step using a reproducible damage-planning procedure.

Each image is annotated with bounding boxes for integrated circuits (ICs) and capacitors in COCO format, accompanied by metadata detailing the damage type and sequence. Designed for training and benchmarking models in low-data-volume scenarios, the dataset supports applications in quality control, manufacturing, and computer vision research.

License: CC BY-SA 4.0Related resources: Dataset description [link]