QD12 多刻线样板标准装置

粗糙度用于零件表面结构的分析，粗糙度对产品的质量起重要作用；对零件的磨损、寿命，及机器运转的噪声均有重要影响，为满足工业上对粗糙度检测的要求，同时保证量值统一、准确、可靠，建立本计量标准。该标准器组主要由多刻线样板和单刻线样板组成。单刻线样板主要用来检定干涉显微镜和光切显微镜。对于干涉显微镜，采用光波干涉法直接测量单刻线样板，使用测微目镜依次测得正反向行程时干涉条纹的弯曲量和相邻两个干涉条纹的间距，用其平均值计算出单刻线样板的刻线深度，与样板的实际值相比较，计算出干涉显微镜示值误差。Roughness is used for the analysis of the surface structure of mechanical parts, and plays a critical role in product quality. It also exerts significant impacts on parts wear, service life, and the operating noise of machinery. To meet the industrial requirements for roughness detection and ensure uniform, accurate and reliable measured values, this metrological standard is established. This standard instrument set mainly consists of multi-line masters and single-line masters. The single-line masters are primarily used for calibrating interference microscopes and light-section microscopes. For interference microscopes, the single-line masters are directly measured via the light wave interference method. The bending amount of interference fringes and the spacing between two adjacent interference fringes during forward and reverse strokes are sequentially measured using a micrometer eyepiece. The groove depth of the single-line master is calculated from the average of these measured values, and the indication error of the interference microscope is obtained by comparing the calculated value with the actual value of the master.

搜集汇总

背景与挑战

背景概述

该数据集是'QD12 多刻线样板标准装置'，属于国家计量科学数据中心，主要用于粗糙度测量和零件表面结构分析。它由多刻线样板和单刻线样板组成，用于检定干涉显微镜和光切显微镜，以确保工业测量中的量值统一和准确性。数据集通过线上方式完全共享，适用于计量领域的科研和应用。