FIG. 1. AFM (a), SEM (b), panchromatic CL (c), and ADF-STEM (d) performed on the same micrometre-scale area. To guide the eye, a few dislocations are indicated by arrows in each picture. (e) High-reso
An integrated quantum circuit is demonstrated. The electrical measurements data at sub-Kelvin temperatures in presence/absence of magnetic fields are discussed. Data are taken in Cavendish Lab, Univer
Table shows the systematic literature review search strategy (.pdf file) that was used to identify all the relevant studies relating to material extrusion additive manufacturing dimensional accuracy.