直立取向锑基硫属化合物薄膜数据

直立取向锑基硫属化合物薄膜数据主要面向锑基硫属化合物结晶取向进行测试研究，基于中国计量科学研究院测试数据产生，主要记录了锑基硫属化合物生长取向数据依据射线粉末衍射用仪器响应标准物质的PDF卡片进行标定，参照NIM-ZY-QY-CL-002 X 射线衍射仪测量薄膜物相作业指导书检测与验证。数据量0.89MBThe vertically oriented antimony-based chalcogenide thin film dataset is primarily intended for testing and research on the crystalline orientation of antimony-based chalcogenide compounds. It is generated using test data from the National Institute of Metrology of China (NIM), and mainly documents the growth orientation data of antimony-based chalcogenide compounds, which are calibrated against the PDF cards of standard reference materials for X-ray powder diffraction instrument response. The detection and validation of the data are conducted in accordance with the NIM-ZY-QY-CL-002 X-ray Diffractometer Thin Film Phase Measurement Operation Guideline. The dataset has a size of 0.89 MB.

搜集汇总

背景与挑战

背景概述

该数据集聚焦于锑基硫属化合物的结晶取向研究，基于中国计量科学研究院的测试数据，通过X射线衍射方法记录并验证了薄膜的生长取向信息。数据由华中科技大学创建，隶属于一项国家重点研发计划项目，旨在支持太阳能电池相关研究。