The Weierstrass series was considered in Ciavarella et al. (Ciavarella et al. 2000 Proc. R. Soc. Lond. A 456, 387â405. (doi:10.1098/rspa.2000.0522)) to describe a linear contact problem between a ri
Atomic force microscopy (AFM) topography images of a chromium nitride (CrN) sample deposited on a prime-grade polished silicon wafer. Six measurements are included with scan sizes of respectively 0.51
