State of the art electron microscopes produce focused electron beams with atomic dimensions and allow to capture diffraction patterns arising from the interaction of incident electrons with nanoscale
This dataset consists of X-ray absorption fine structure (XAFS) spectra at Na K-edge of Sodium carbonate measured at Ritsumeikan-SR BL-10, and is a part of XAFS database (MDR XAFS DB, https://doi.org/
