CIM PVT校准测试数据集

本数据集面向课题2 支持存内计算的SRAM IP的研究，记录了CIM IP的PVT校准指标测试所使用的测试用例和产生的测试结果。测试用例主要包含可执行的ARM程序和仿真器脚本，测试结果是搭载包含CIM IP的芯片的测试板在0.6V、0.9V、0.95V和1.0V不同电压下分别进行无校准和有校准的测试，串口输出的包含CIM IP卷积计算结果的日志记录。This dataset is developed for the research of Topic 2 on in-memory computing-enabled SRAM IP. It records the test cases used and test results generated during the PVT calibration index testing of the CIM IP. The test cases mainly include executable ARM programs and emulator scripts. The test results are serial-port-output log records containing the convolution computation results of the CIM IP, which are collected from a test board equipped with a chip integrating the CIM IP under both calibrated and uncalibrated conditions at four distinct supply voltages: 0.6V, 0.9V, 0.95V, and 1.0V.

搜集汇总

背景与挑战

背景概述

该数据集支持存内计算SRAM IP的研究，包含CIM IP的PVT校准测试用例和结果，涉及不同电压下的卷积计算测试。数据由戚隆宁；东南大学提供，总大小为31.61MB，包含14个文件。