New approach to controllable nitrogen doping for improved nano-semiconductors

The data covers the following:<br>X-ray photoelectron spectroscopy (XPS) - to collect surface chemical structure changes (using RMIT instrument);<br>Scanning electron microscopy (SEM) - to collect surface physical structure changes;<br>Atomic force microscopy (AFM) - to collect surface morphology changes;<br>Internal/External quantum efficiency (IQE/EQE) – to collect DSSC (Dye Sensitised Solar Cells) efficiency data;<br>Discharge/Charge capacity - to collect battery efficiency data.