Supplement to Roughness, porosity and refraction index of AgI thin films

Supplementary materials to: M. A. Kononov, I.A. Maslyanitsyn, V. V. Savranskii, V.D. Shigorin, S. I. Valjanskii, Roughness, porosity and refraction index of AgI thin films. File AgIAFM.gwy - AFM images of the investigated AgI films (Ag film deposition time is indicated) on the glass substrate. Part of the films (left) is removed for the film thickness measurements. File Spectra.xls – experimental and calculated spectra of the samples. Models used are briefly mentioned in the file.