XPS measurement of the Fe-Ti based materials

The mono‐ and bimetal‐modified (Pd, Cu) titanium(IV) oxide and iron oxide (III) photocatalysts were prepared by chemical reduction method and characterized using XPS method. The composition of elements incorporated in the surface layer of mono- and bimetallic photocatalysts was determined by XPS analysis, as well as the valence state of elements. Measurements confirmed composition and presence of Pd and Cu dopants. Additionally it confirmed a mixed valence state of Fe in a iron oxides structures.