Atomic Data and Ionization State Distributions for Xe44+, Xe51+ and W64+ ions

The x-ray imaging crystal spectrometer (XICS) is proposed as the principal method of diagnostics for plasma ion temperature and rotation for the China Fusion Engineering Test Reactor (CFETR) for its simplicity in implementation and no reliance on neutral beams. For D–T experiments with the electron temperature as high as 35–40 keV at the core region, highly charged high-Z ions can serve as the diagnostic ions for the XICS. For the CFETR, Xe44+, Xe51+, and W64+ are selected as the impurity ions. This dataset includes the atomic data and the ionization state distribution data used in the article Design consideration of an x-ray imaging crystal spectrometer for China Fusion Engineering Test Reactor.