Dynamical Simulation of On-axis Transmission Kikuchi Patterns Based on Accurate Diffraction Geometry Calibration

Data bundle for: Dynamical Simulation of On-axis Transmission Kikuchi and Spot Diffraction Patterns, Based on Accurate Diffraction Geometry Calibration by T. Zhang, R. Gauvin, A. Winkelmann, T. B. Britton Contents in the compressed files: TKPs: experimental Transmission Kikuchi patterns (TKPs) at 25 keV and 30 keV. Raw (and .h5 and .png) and background corrected patterns (.png) available. ECP: experimental and simulated electron channeling patterns (ECPs) of the Si sensor of the detector, corresponding to the TKD experiments. Original and contrast enhanced patterns available. Patterns are captured at 20 keV. Patterns can be analyzed by AstroECP. See: Qaiser, M. H., Berners, L., Scales, R. J., Zhang, T., Heller, M., Dluhoš, J., Korte-Kerzel, S., & Britton, T. B. (2026). AstroECP: towards more practical electron channeling contrast imaging. Journal of Applied Crystallography, 59. https://doi.org/10.1107/S1600576726000567. TKP_Simulated: individual simulated TKPs. TKP-Individual: individual CPE, IDI and spot patterns as image files TKP-Phenomenological: summed patterns, from the phenomenological approach, as image files TKP-Monte-Carlo: summed patterns, from the Monte Carlo simulation-based approach, as image files Monte Carlo Simulations can be found in the main folder. MoO3_100nm_30keV_EMean_E2.txt is the mean and error of energy of scattered electrons as a function of scattering angle. MoO3_100nm_30keV_En_Th.txt is the main da a matrix. X axis is scattering angle (ascending order) in rad from 0 to 3.2, and Y is energy (descending order) in keV from 30 to 0.