The Carinthia dataset contains Scanning Electron Microscope (SEM) images of defects found on one production layer of unstructured semiconductor wafers. The dataset consists of 4,591 images unevenly di
This dataset contains 1050 multi-pattern multi-bin wafer bin maps (WBMs) synthesized from WM-811K binary WBM dataset and real world multi-bin WBMs using a trained pix2pix model.
We propose to continue laser spectroscopy measurements of the muonium (Mu-) centres in n-type doped silicon carbide. Scanning a wide wavelength range, and changing the relative...
