Tomas Grejtak - Chromium nitride sample #C24

The surface topography of a chromium nitride sample #C24 was measured using a scanning white-light interferometer (Wyko model NT 9100, Bruker USA). Each measurement was done using the same conditions: Objective: 10X Image Size: 878 x 657 µm Pixel size: 0.642 µm Scanning mode: VSI The surface topographies, post-processing and roughness calculations (the average roughness (Ra) and the root mean square roughness (Rq)) were done using Vision 4.10 Software (Veeco Instruments, Inc). The surface was not initially flat and was tilted using Vision’s “Tilt (Plane Fit)” function. The surface did not require additional filtering. Three measurements were performed on each sample. The values from the three measurements were used to determine the average and standard deviation of the roughness values. The standard deviation was determined using Excel function “STDEV”. Prior to the topography measurements, all samples were rinsed in methanol and the surface was blown dry using a compressed air.