Supporting Information
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资源简介：
See the supplementary material for the XRD patterns, morphological scans, and PFM ferroelectric polarization tests of AlScN films with different Sc doping ratios; the I-V characterization curves of AlScN thin films under different Sc target sputtering powers; and the mathematical description of weight modulation in the STDP circuit model.
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AIP Publishing创建时间：
2025-07-31
