We propose a method for analyzing the variability in smooth, possibly nonlinear, functionals associated with a set of product production trajectories measured under different experimental conditions.
This data set was generated in accordance with the semiconductor industry and contains sensor recordings from high-precision and high-tech production equipment. Basically, the semiconductor production
Dataset related to paper Development of a novel continuous filtration unit for pharmaceutical process development and manufacturing (https://doi.org/10.1016/j.xphs.2018.07.005) and for the proceeding
