DESY-II test-beam measurements and simulation data for novel silicon and GaAs sensors

The experiment evaluated two samples of silicon pad sensors and two samples of GaAs sensors. These were tested at the DESY-II test-beam center on the TB24 beam line using 5 GeV electrons. The electron beam was delivered in 20 ms pulses (containing approximately 50 electrons each) with an 80 ms period. A technological prototype was developed to demonstrate the performance capabilities of the ECAL sensors. Data readout was performed using an ultra-low-power ASIC known as FLAME. FPGAs were utilized to pre-process and deconvolute the raw data. The primary objective of this study was to evaluate the homogeneity of the sensor responses and investigate edge effects.